subject predicate object context
46016 Creator c3baa1aae2495d9fcf383c433b46bfe0
46016 Creator ext-42f6da4c045a73512a8e0864b7fd4c3d
46016 Creator ext-0c438fad62ddac9a0af6ea0795747cb5
46016 Creator ext-9836d72ad20ef1e61189679e62b73d36
46016 Creator ext-e035166d2aef4b25b2e2998d249a67d8
46016 Date 2015-05-19
46016 Is Part Of repository
46016 abstract The thermal cycling reliability of candidate copper and aluminium power substrates has been assessed for use at temperatures exceeding 300°C peak using a combination of thermal cycling, nanoindentation and finite element modelling to understand the relative stresses and evolution of the mechanical properties. The results include the relative cycling lifetimes up to 350°C, demonstrating almost an order of magnitude higher lifetime for active metal brazed Al / AlN substrates over Cu / Si<sub>3</sub>N<sub>4</sub>, but four times more severe roughening and cracking of the Ni-P plating's on the Al / AlN (DBA) substrates. The nonlinear finite element modelling illustrated that the yield strength of the metal and the thickness of the ceramic are the main stress controlling factors, but comparisons with the cycling lifetime results demonstrated that the fracture toughness (resistance) of the ceramic is the over-riding controlling factor for the overall passive thermal cycling lifetimes. In order to achieve the highest substrate lifetime for the highly stressed high temperature thermal cycled applications, the optimum solution appears to be annealed copper, brazed on to a thicker than normal or higher fracture toughness Si<sub>3</sub>N<sub>4</sub> ceramic.
46016 authorList authors
46016 presentedAt ext-4b4782ace13874022f01836da47bc9f4
46016 status peerReviewed
46016 uri http://data.open.ac.uk/oro/document/430098
46016 uri http://data.open.ac.uk/oro/document/430100
46016 uri http://data.open.ac.uk/oro/document/430105
46016 uri http://data.open.ac.uk/oro/document/430106
46016 uri http://data.open.ac.uk/oro/document/430107
46016 uri http://data.open.ac.uk/oro/document/430108
46016 uri http://data.open.ac.uk/oro/document/434681
46016 type AcademicArticle
46016 type Article
46016 label Hamilton, Dean P.; Mills, Liam; Bowen, James ; Jennings, Michael R. and Mawby, Philip A. (2015). High temperature reliability of power module substrates. In: PCIM Europe 2015, 19-20 May 2015, Nuremburg, Germany.
46016 label Hamilton, Dean P.; Mills, Liam; Bowen, James ; Jennings, Michael R. and Mawby, Philip A. (2015). High temperature reliability of power module substrates. In: PCIM Europe 2015, 19-20 May 2015, Nuremburg, Germany.
46016 Title High temperature reliability of power module substrates
46016 in dataset oro