45373 |
Creator |
9ac1d268bb57f50a76301a873fb56d23 |
45373 |
Creator |
ext-ac44814ae9aa82c023f9198cc1cf750d |
45373 |
Creator |
ext-9992fb0b66d942c38161a031799a0a62 |
45373 |
Creator |
ext-9e9d4d9367e5aea64585b22f8bb7c6a1 |
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Date |
2010 |
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Is Part Of |
repository |
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abstract |
Application of defect predictors in software development helps the managers to allocate
their resources such as time and effort more efficiently and cost effectively to test
certain sections of the code. In this research, we have used naive Bayes classifier
(NBC) to construct our defect prediction framework. Our proposed framework uses the
hierarchical structure information about the source code of the software product,
to perform defect prediction at a functional method level and source file level. We
have applied our model on SoftLAB and Eclipse datasets. We have measured the performance
of our proposed model and applied cost benefit analysis. Our results reveal that source
file level defect prediction improves the verification effort, while decreasing the
defect prediction performance in all datasets. |
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authorList |
authors |
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presentedAt |
ext-7033a80ad87fd68d532627691a781d6e |
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status |
peerReviewed |
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uri |
http://data.open.ac.uk/oro/document/406011 |
45373 |
uri |
http://data.open.ac.uk/oro/document/406012 |
45373 |
uri |
http://data.open.ac.uk/oro/document/406013 |
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uri |
http://data.open.ac.uk/oro/document/406014 |
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uri |
http://data.open.ac.uk/oro/document/406015 |
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uri |
http://data.open.ac.uk/oro/document/406016 |
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uri |
http://data.open.ac.uk/oro/document/410695 |
45373 |
type |
AcademicArticle |
45373 |
type |
Article |
45373 |
label |
Calikli, Gul ; Tosun, Ayse; Bener, Ayse and Celik, Melih (2010). The effect of granularity
level on software defect prediction. In: 24th International Symposium on Computer
and Information Sciences (ISCIS 2009), 14-16 Sep 2009, METU Northern Cyprus Campus,
Guzelyurt, Cyprus, pp. 531–536. |
45373 |
label |
Calikli, Gul ; Tosun, Ayse; Bener, Ayse and Celik, Melih (2010). The effect of
granularity level on software defect prediction. In: 24th International Symposium
on Computer and Information Sciences (ISCIS 2009), 14-16 Sep 2009, METU Northern Cyprus
Campus, Guzelyurt, Cyprus, pp. 531–536. |
45373 |
Title |
The effect of granularity level on software defect prediction |
45373 |
in dataset |
oro |