subject predicate object context
45351 Creator 9ac1d268bb57f50a76301a873fb56d23
45351 Creator ext-773f05d155072ed374556586b3652360
45351 Creator ext-0ded50e9efa8f892c42eafd9bca74614
45351 Creator ext-1532a5c96d41c816329e4901d85ef5d0
45351 Creator ext-2666d7ffd71f767deede06111a87d97b
45351 Creator ext-3b8fc2f384210cf1e8c667c9d03cfb72
45351 Date 2012-11-11
45351 Is Part Of repository
45351 abstract We present an integrated measurement and defect prediction tool: <i>Dione</i>. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of <i>Dione</i> followed by an overview of our demonstration.
45351 authorList authors
45351 presentedAt ext-dba2dfad80498ca1c77ad300be9a900d
45351 status peerReviewed
45351 uri http://data.open.ac.uk/oro/document/404650
45351 uri http://data.open.ac.uk/oro/document/404655
45351 uri http://data.open.ac.uk/oro/document/404660
45351 uri http://data.open.ac.uk/oro/document/404661
45351 uri http://data.open.ac.uk/oro/document/404662
45351 uri http://data.open.ac.uk/oro/document/404663
45351 uri http://data.open.ac.uk/oro/document/410697
45351 type AcademicArticle
45351 type Article
45351 label Caglayan, Bora; Tosun Misirli, Ayse; Calikli, Gul ; Aytac, Turgay; Bener, Ayse and Turhan, Burak (2012). Dione: An Integrated Measurement and Defect Prediction Solution. In: 20th International Symposium on the Foundations of Software Engineering (ACM SIGSOFT 2012 FSE-20), 11-16 Nov 2012, Cary, North Carolina, USA.
45351 label Caglayan, Bora; Tosun Misirli, Ayse; Calikli, Gul ; Aytac, Turgay; Bener, Ayse and Turhan, Burak (2012). Dione: An Integrated Measurement and Defect Prediction Solution. In: 20th International Symposium on the Foundations of Software Engineering (ACM SIGSOFT 2012 FSE-20), 11-16 Nov 2012, Cary, North Carolina, USA.
45351 Title Dione: An Integrated Measurement and Defect Prediction Solution
45351 in dataset oro