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Creator |
9ac1d268bb57f50a76301a873fb56d23 |
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Creator |
ext-773f05d155072ed374556586b3652360 |
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Creator |
ext-0ded50e9efa8f892c42eafd9bca74614 |
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Creator |
ext-1532a5c96d41c816329e4901d85ef5d0 |
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Creator |
ext-2666d7ffd71f767deede06111a87d97b |
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Creator |
ext-3b8fc2f384210cf1e8c667c9d03cfb72 |
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Date |
2012-11-11 |
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Is Part Of |
repository |
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abstract |
We present an integrated measurement and defect prediction tool: <i>Dione</i>. Our
tool enables organizations to measure, monitor, and control product quality through
learning based defect prediction. Similar existing tools either provide data collection
and analytics, or work just as a prediction engine. Therefore, companies need to deal
with multiple tools with incompatible interfaces in order to deploy a complete measurement
and prediction solution. Dione provides a fully integrated solution where data extraction,
defect prediction and reporting steps fit seamlessly. In this paper, we present the
major functionality and architectural elements of <i>Dione</i> followed by an overview
of our demonstration. |
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authorList |
authors |
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presentedAt |
ext-dba2dfad80498ca1c77ad300be9a900d |
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status |
peerReviewed |
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uri |
http://data.open.ac.uk/oro/document/404650 |
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uri |
http://data.open.ac.uk/oro/document/404655 |
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uri |
http://data.open.ac.uk/oro/document/404660 |
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uri |
http://data.open.ac.uk/oro/document/404661 |
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uri |
http://data.open.ac.uk/oro/document/404662 |
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uri |
http://data.open.ac.uk/oro/document/404663 |
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uri |
http://data.open.ac.uk/oro/document/410697 |
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type |
AcademicArticle |
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type |
Article |
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label |
Caglayan, Bora; Tosun Misirli, Ayse; Calikli, Gul ; Aytac, Turgay; Bener, Ayse and
Turhan, Burak (2012). Dione: An Integrated Measurement and Defect Prediction Solution.
In: 20th International Symposium on the Foundations of Software Engineering (ACM SIGSOFT
2012 FSE-20), 11-16 Nov 2012, Cary, North Carolina, USA. |
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label |
Caglayan, Bora; Tosun Misirli, Ayse; Calikli, Gul ; Aytac, Turgay; Bener, Ayse
and Turhan, Burak (2012). Dione: An Integrated Measurement and Defect Prediction
Solution. In: 20th International Symposium on the Foundations of Software Engineering
(ACM SIGSOFT 2012 FSE-20), 11-16 Nov 2012, Cary, North Carolina, USA. |
45351 |
Title |
Dione: An Integrated Measurement and Defect Prediction Solution |
45351 |
in dataset |
oro |