| 44815 |
Creator |
c3baa1aae2495d9fcf383c433b46bfe0 |
| 44815 |
Creator |
ext-0d583a452adfb182387b0242e88aadfa |
| 44815 |
Creator |
ext-4fc468ad2a67a295a72bfc827e699cf8 |
| 44815 |
Creator |
ext-87a412f5996cebaef2b51a7adb9e9ae3 |
| 44815 |
Creator |
ext-a3c2b738eb9df4fec35b4f27f32ffa48 |
| 44815 |
Creator |
ext-ee3d5d1654ac70b3e26f21c193a516f1 |
| 44815 |
Date |
2015-11-02 |
| 44815 |
Is Part Of |
repository |
| 44815 |
Is Part Of |
p00406090 |
| 44815 |
abstract |
Amorphous indium–gallium–zinc-oxide (a-IGZO) thin films were deposited using RF magnetron
sputtering on polyethylene naphthalate (PEN) and polyethylene terephthalate (PET)
flexible substrates and their mechanical flexibility investigated using uniaxial tensile
and buckling tests coupled with <i>in situ</i> optical microscopy. The uniaxial fragmentation
test demonstrated that the crack onset strain of the IGZO/PENwas ~2.9%,which is slightly
higher than that of IGZO/PET. Also, uniaxial tensile crack density analysis suggests
that the saturated crack spacing of the film is strongly dependent on the mechanical
properties of the underlying polymer substrate. Buckling test results suggest that
the crack onset strain (equal to ~1.2%, of the IGZO/polymer samples flexed in compression
to ~5.7 mm concave radius of curvature) is higher than that of the samples flexed
with the film being in tension (convex bending) regardless whether the substrate is
PEN or PET. The saturated crack density of a-IGZO film under the compression buckling
mode is smaller than that of the film under the tensile buckling mode. This could
be attributed to the fact that the tensile stress encouraged this crack formation
originating from surface defects in the coating. It could also be due to the buckling
delamination of the thin coating from the substrate at a lower strain than that at
which a crack initiates during flexing in compression. These results provide useful
information on the mechanical reliability of a-IGZO films for the development of flexible
electronics. |
| 44815 |
authorList |
authors |
| 44815 |
issue |
A |
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status |
peerReviewed |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373668 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373685 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373686 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373687 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373688 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/373689 |
| 44815 |
uri |
http://data.open.ac.uk/oro/document/374175 |
| 44815 |
volume |
594 |
| 44815 |
type |
AcademicArticle |
| 44815 |
type |
Article |
| 44815 |
label |
Mohammed, D. W.; Waddingham, R.; Flewitt, A. J.; Sierros, K. A.; Bowen, J. and
Kukureka, S. N. (2015). Mechanical properties of amorphous indium-gallium-zinc oxide
thin films on compliant substrates for flexible optoelectronic devices. Thin Solid
Films, 594(A) pp. 197–204. |
| 44815 |
label |
Mohammed, D. W.; Waddingham, R.; Flewitt, A. J.; Sierros, K. A.; Bowen, J. and Kukureka,
S. N. (2015). Mechanical properties of amorphous indium-gallium-zinc oxide thin films
on compliant substrates for flexible optoelectronic devices. Thin Solid Films, 594(A)
pp. 197–204. |
| 44815 |
Title |
Mechanical properties of amorphous indium-gallium-zinc oxide thin films on compliant
substrates for flexible optoelectronic devices |
| 44815 |
in dataset |
oro |