| 43421 |
Creator |
c3baa1aae2495d9fcf383c433b46bfe0 |
| 43421 |
Creator |
ext-1d71d75b6c97f3ceb28324413df90873 |
| 43421 |
Creator |
ext-580482ffa9729aed850817443d166ceb |
| 43421 |
Creator |
ext-9a81951164df61e8f5cf65d45863a7b6 |
| 43421 |
Date |
2010-03-11 |
| 43421 |
Is Part Of |
repository |
| 43421 |
abstract |
Indium tin oxide (ITO) is a semiconducting material combining high conductivity and
high transparency in the visible range. It is the most widely used transparent conducting
oxide in applications such as flat panel displays. In this work, ITO thin films were
deposited by pulsed laser deposition (PLD) onto transparent glass substrates. The
substrate temperature and oxygen pressure during deposition were controlled to generate
a variety of microstructures and electro-optical properties. Similar film thicknesses
were used to avoid any change of carrier concentration. The dielectric function and
complex refractive index were derived using spectroscopic ellipsometry and electron
energy loss spectroscopy. |
| 43421 |
authorList |
authors |
| 43421 |
presentedAt |
ext-188a150cb76664307b31e74605eab16e |
| 43421 |
status |
nonPeerReviewed |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/319607 |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/319608 |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/319609 |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/319610 |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/319611 |
| 43421 |
uri |
http://data.open.ac.uk/oro/document/321924 |
| 43421 |
type |
AcademicArticle |
| 43421 |
type |
Article |
| 43421 |
label |
Giusti, Gael; Bowen, James ; Abell, J. Stuart and Jones, Ian P. (2010). Microstructure
and dielectric function modelling by spectroscopic ellipsometry and energy electron
loss spectroscopy of In2O3:Sn thin films. In: Frontiers in EELS, 11-12 Mar 2010,
Vienna, Austria. |
| 43421 |
label |
Giusti, Gael; Bowen, James ; Abell, J. Stuart and Jones, Ian P. (2010). Microstructure
and dielectric function modelling by spectroscopic ellipsometry and energy electron
loss spectroscopy of In2O3:Sn thin films. In: Frontiers in EELS, 11-12 Mar 2010,
Vienna, Austria. |
| 43421 |
Title |
Microstructure and dielectric function modelling by spectroscopic ellipsometry and
energy electron loss spectroscopy of In<sub>2</sub>O<sub>3</sub>:Sn thin films |
| 43421 |
in dataset |
oro |