| 43402 |
Creator |
c3baa1aae2495d9fcf383c433b46bfe0 |
| 43402 |
Creator |
ext-453fe1e8cae66fe5771e448110b07b1a |
| 43402 |
Date |
2012-12-14 |
| 43402 |
Is Part Of |
repository |
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abstract |
The objective of this research was to answer the question “Does there exist an optimal
range of analysis conditions for the measurement of nanoscale surface roughness?”
Characterisation of the surface topography of a selection of polished, machined, deposited
and cast materials over a range of length scales was performed using atomic force
microscopy. The average roughness, Ra, was calculated for each image. |
| 43402 |
authorList |
authors |
| 43402 |
presentedAt |
ext-d9f2ddea332aaf95806111887b20e4fd |
| 43402 |
status |
nonPeerReviewed |
| 43402 |
type |
AcademicArticle |
| 43402 |
type |
Article |
| 43402 |
label |
Bowen, James and Cheneler, David (2012). Optimisation of nanoscale surface topography
analysis. In: RSC Postgraduate Symposium on Nanotechnology, 14 Dec 2012, Birmingham,
UK. |
| 43402 |
label |
Bowen, James and Cheneler, David (2012). Optimisation of nanoscale surface topography
analysis. In: RSC Postgraduate Symposium on Nanotechnology, 14 Dec 2012, Birmingham,
UK. |
| 43402 |
Title |
Optimisation of nanoscale surface topography analysis |
| 43402 |
in dataset |
oro |