| 58773 |
Creator |
f3373d08ec758439e9fe2f9710200cb0 |
| 58773 |
Creator |
ext-b52276664157374a1ebadad9d7979833 |
| 58773 |
Creator |
ext-9120eb561524638b0d3145a49ffddf37 |
| 58773 |
Creator |
ext-c4faf414446628fd173c51fc8dda604c |
| 58773 |
Date |
2019-01 |
| 58773 |
Is Part Of |
p17480221 |
| 58773 |
Is Part Of |
repository |
| 58773 |
abstract |
Depletion of the sensitive volume for semiconductor based detectors is a key to achieve
high performance. It is for instance required for charged particle detection in highly
radiative environment and for X-ray spectroscopy.
PIPPER-2 is a CMOS pixel sensor featuring an architecture that allows the application
of the reverse bias of the pn junction from the frontside (cathode), on the electronic
side, without process modification. Biasing voltages up to 45 V have been applied
to sensor prototypes fabricated on two different high resistivity substrates: a thin
epitaxial layer (1 kΩ cm) and a 40 μm thick bulk substrate (600 Ω cm).
Calculations from a simplified analytical model and 3D-TCAD simulations were conducted
to predict the evolution of the depletion depth with the bias voltage. These expectations
were compared to measurements of PIPPER-2 illuminated with two X-ray energies.
We conclude that the frontside biasing method allows the full-depletion of the thin
epitaxial layer. In contrast, depletion of the bulk substrate reaches about half-depth
but X-rays are still detected over the full depth. |
| 58773 |
authorList |
authors |
| 58773 |
issue |
1 |
| 58773 |
status |
peerReviewed |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764188 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764189 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764190 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764191 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764192 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764193 |
| 58773 |
uri |
http://data.open.ac.uk/oro/document/764661 |
| 58773 |
volume |
14 |
| 58773 |
type |
AcademicArticle |
| 58773 |
type |
Article |
| 58773 |
label |
Heymes, J. ; Dorokhov, A.; Kachel, M. and Baudot, J. (2019). Study of the depletion
depth in a frontside biased CMOS pixel sensors. Journal of Instrumentation, 14(1),
article no. P01018. |
| 58773 |
label |
Heymes, J. ; Dorokhov, A.; Kachel, M. and Baudot, J. (2019). Study of the depletion
depth in a frontside biased CMOS pixel sensors. Journal of Instrumentation, 14(1),
article no. P01018. |
| 58773 |
Title |
Study of the depletion depth in a frontside biased CMOS pixel sensors |
| 58773 |
in dataset |
oro |